Published/Posted: May 5, 2025
Authors: R. Kudalippalliyalil; G. Prakash; C. Munley; K. E. Grutter; T. E. Murphy
DOI: 10.1364/CLEO_SI.2025.SS139_4
Abstract: We present a polarization-dependent, ultrasensitive technique for probing transient optical changes in atomically thin molybdenum disulfide (MoS2) layers integrated onto silicon nitride racetrack resonators.Citation:
R. Kudalippalliyalil, G. Prakash, C. Munley, K. E. Grutter and T. E. Murphy, "Ultrasensitive Polarization-Resolved Probing of Transient Dynamics in MoS2on Silicon Nitride Microresonators", Conference on Lasers and Electrooptics (CLEO) Long Beach, CA (USA) SS139_4 (2025)
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