Characterization of Free-Carrier Nonlinearities in Porous Silicon Waveguides

Published/Posted: February 1, 2009

Authors: P. Apiratikul; A. M. Rossi; T. E. Murphy

DOI: 10.1364/CLEO.2009.CThU7

Abstract: We report the measurement of free-carrier nonlinearities in nanoporous silicon waveguides at 1550 nm. Although the waveguide is approximately 70% porous, it exhibits stronger and faster free-carrier effects than those of crystalline silicon waveguides.

Citation:
P. Apiratikul, A. M. Rossi and T. E. Murphy, "Characterization of Free-Carrier Nonlinearities in Porous Silicon Waveguides", Conference on Lasers and Electro-Optics (CLEO), Baltimore, MD (USA) CThU7 (2009)
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