TY - JOUR AU - Wathen, Jeremiah J. AU - Pagán, Vincent R. AU - Murphy, Thomas E. TI - Simple method to characterize nonlinear refraction and loss in optical waveguides JO - Opt. Lett. VL - 37 IS - 22 SP - 4693 EP - 4695 PY - 2012 DO - 10.1364/OL.37.004693 AB - We describe a technique for accurately measuring the ratio between the imaginary and real parts of the third-order nonlinearity in optical waveguides. Unlike most other methods, it does not depend on precise knowledge of the coupling efficiencies, optical propagation loss, or optical pulse shape. We apply the method to characterize a silicon waveguide, a GaAs waveguide, and AlGaAs waveguides with different alloy concentrations. ER -